Brochure
HH-LIBS versus HH-XRF Technology
Applications
Technical Specifications
Accessories
Benchtop Stand
For repeated measurements in environments where surfaces are available, the benchtop stand allows the HELIUS to be mounted and samples placed within a radiation shielded compartment for ease of analysis.
Lightweight Jig
Allows the HELIUS to be mounted for easy measurements of powder samples – with a safety top cap also supplied.
Heat Jacket & Gloves
Significantly reduces the impact of high temperatures on the analyser and operator when measuring high temperature samples up to 500°C. A high temperature window film is also available.
Features of the HELIUS (XRF)
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Login Screen
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The Ready screen to start testing samples
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Warning Screen to indicate when the instrument is on.
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Main Interface Screen and Exist Screen